Spectroscopic Ellipsometry for Photovoltaics

Spectroscopic Ellipsometry for Photovoltaics

Volume 2: Applications and Optical Data of Solar Cell Materials

Fujiwara, Hiroyuki; Collins, Robert W.

Springer International Publishing AG

01/2019

616

Dura

Inglês

9783319951379

15 a 20 dias

1118

Descrição não disponível.
Introduction.- Part I: Application of Ellipsometry Technique.- Analysis of Optical and Recombination Losses in Solar Cells.- Optical Simulation of External Quantum Efficiency Spectra.- Characterization of Textured Structures.- On-line Monitoring of Photovoltaics Production.- Real Time Measurement, Monitoring, and Control of CuIn1-xGaxSe2 by Spectroscopic Ellipsometry.- Real Time and Mapping Spectroscopic Ellipsometry of Hydrogenated Amorphous and Nanocrystalline Si Solar Cells.- Part II: Optical Data of Solar-Cell Component Materials.- Inorganic Semiconductors and Passivation Layers.- Organic Semiconductors.- Organic-Inorganic Hybrid Perovskites.- Transparent Conductive Oxides.- Metals.- Substrates and Coating Layers.
Amorphous Si solar cells;CIGS growth ananlysis;Compound solar cells;Hybrid perovskites;Microcrystalline Si solar cells;Nanomaterial-based solar cells;Optical analysis of solar cells;Optical constants of solar materials;Organic solar cells;Si heterojunction solar cells;Spectroscopic ellipsometry