Structural, Syntactic, and Statistical Pattern Recognition
Structural, Syntactic, and Statistical Pattern Recognition
Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings
Ho, Tin Kam; Biggio, Battista; Robles-Kelly, Antonio; Hancock, Edwin R.; Bai, Xiao; Wilson, Richard C.
Springer International Publishing AG
08/2018
524
Mole
Inglês
9783319977843
15 a 20 dias
819