Transmission Electron Microscopy
-15%
portes grátis
Transmission Electron Microscopy
Diffraction, Imaging, and Spectrometry
Carter, C. Barry; Williams, David B.
Springer International Publishing AG
09/2016
518
Dura
Inglês
9783319266497
15 a 20 dias
Descrição não disponível.
Foreword by Sir John Meurig Thomas.- 1. Electron Sources.- 2. In Situ and Operando.- 3. Electron Diffraction and Phase Identification.- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns.- 5. Electron crystallography, charge-density mapping and nanodiffraction.- 6. Digital Micrograph.- 7. Electron waves, interference & coherence.- 8. Electron Holography.- 9. Focal-Series Reconstruction.- 10. Direct Methods For Image Interpretation.- 11. Imaging in the STEM.- 12. Electron Tomography.- 13. Energy-Filtered Transmission Electron Microscopy.- 14. Calculation of Electron Energy-Loss Spectra.- 15. Electron Diffraction & X-Ray Excitation.- 16. X-Ray and Electron Energy-Loss Spectral Imaging.- 17. Practical Aspects and Advanced Applications of XEDS.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
EELS;EFTEM;Electron Diffraction;Electron Holography;Electron Sources;Electron Tomography;Focal-series reconstruction;Operando TEM;Spectrum Imaging;TEM Textbook;Transmission Electron Microscopy;XEDS
Foreword by Sir John Meurig Thomas.- 1. Electron Sources.- 2. In Situ and Operando.- 3. Electron Diffraction and Phase Identification.- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns.- 5. Electron crystallography, charge-density mapping and nanodiffraction.- 6. Digital Micrograph.- 7. Electron waves, interference & coherence.- 8. Electron Holography.- 9. Focal-Series Reconstruction.- 10. Direct Methods For Image Interpretation.- 11. Imaging in the STEM.- 12. Electron Tomography.- 13. Energy-Filtered Transmission Electron Microscopy.- 14. Calculation of Electron Energy-Loss Spectra.- 15. Electron Diffraction & X-Ray Excitation.- 16. X-Ray and Electron Energy-Loss Spectral Imaging.- 17. Practical Aspects and Advanced Applications of XEDS.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
