Electron Nano-imaging
-15%
portes grátis
Electron Nano-imaging
Basics of Imaging and Diffraction for TEM and STEM
Tanaka, Nobuo
Springer Verlag, Japan
08/2024
384
Dura
9784431569398
15 a 20 dias
Descrição não disponível.
Chapter 1 Seeing nanometer-sized world.- Chgapter 2 Structure and imaging of a transmission electron microscope (TEM).- Chapter 3 Basic theories of TEM imaging.- Chapter 4 Resolution and image contrast of a transmission electron microscope (TEM).- Chapter 5 What is high-resolution transmission electron microscopy ?.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Nanometer-sized Objects;High-resolution Electron Microscopy;Transmission Electron Microscopy (TEM);Scanning Transmission Electron Microscopy (STEM);Annular Dark Field (ADF) STEM;Annular Bright Field (ABF) STEM;Differential Phase Contrast (DPC) STEM;Image Contrast of TEM and STEM;Electron Nano-diffraction;Electron-energy Loss Spectroscopy (EELS);Energy-filtered TEM (EFTEM);Lattice-fringe Imaging in TEM;Structure Image in TEM;Contrast Transfer Function (CTF);Image Simulation;Continuous or Pulsed Electron Sources;Aberration Corrector;Monochromator;Sparse-coding Image Processing;Pulsed electron gun
Chapter 1 Seeing nanometer-sized world.- Chgapter 2 Structure and imaging of a transmission electron microscope (TEM).- Chapter 3 Basic theories of TEM imaging.- Chapter 4 Resolution and image contrast of a transmission electron microscope (TEM).- Chapter 5 What is high-resolution transmission electron microscopy ?.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Nanometer-sized Objects;High-resolution Electron Microscopy;Transmission Electron Microscopy (TEM);Scanning Transmission Electron Microscopy (STEM);Annular Dark Field (ADF) STEM;Annular Bright Field (ABF) STEM;Differential Phase Contrast (DPC) STEM;Image Contrast of TEM and STEM;Electron Nano-diffraction;Electron-energy Loss Spectroscopy (EELS);Energy-filtered TEM (EFTEM);Lattice-fringe Imaging in TEM;Structure Image in TEM;Contrast Transfer Function (CTF);Image Simulation;Continuous or Pulsed Electron Sources;Aberration Corrector;Monochromator;Sparse-coding Image Processing;Pulsed electron gun
